Researchers of the Institute for Soil Sciences and Agricultural Institute used root electrical capacitance method for non-destructive phenotyping of winter wheat cultivars, and published their results in ”Plants” journal (IF: 4.5, Q1) in open access form. They found significant linear relationships between the electrical capacitance measured at flowering and aboveground biomass, nutrient status (based on the measurement of flag-leaf area and chlorophyll content) and grain yield at a plant and plot scale. Therefore, root electrical capacitance can be considered as a new predictor variable in allometric models of forecasting cereal growth, contributing to an improved crop management and selection strategy.